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VLSI testing

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Published by North-Holland, Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co. in Amsterdam, New York, New York, N.Y., U.S.A .
Written in English

Subjects:

  • Integrated circuits -- Very large scale integration -- Testing.

Book details:

Edition Notes

Includes bibliographies.

Statementedited by T.W. Williams.
SeriesAdvances in CAD for VLSI ;, v. 5
ContributionsWilliams, T. W., 1943-
Classifications
LC ClassificationsTK7874 .V5666 1986
The Physical Object
Paginationix, 275 p. :
Number of Pages275
ID Numbers
Open LibraryOL2711634M
ISBN 100444878955
LC Control Number86004410

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